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1

Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness

R. Khlil, A. El Hdiy, A.F. Shulekin, S.E. Tyaginov, M.I. Vexler

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 272 KB

english, 2004

2

The positive charge neutralisation after bi-directional stress on MOS capacitors

D Ziane, A El-Hdiy

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 132 KB

english, 2000

3

The effects of an uncapped nanocrystal on a simulated induced current collected by a nano-contact

Doan, Quang-Tri, El Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 686 KB

english, 2015

4

On the relaxation of field induced oxide charge in metal-oxide-semiconductor capacitors

A. Meinertzhagen, V. Henry, C. Petit, A. El Hdiy, M. Jourdain

Journal:

Solid-State Electronics

Year:

1994

Language:

english

File:

PDF, 289 KB

english, 1994

5

Tunnel charge transport within silicon in reversely-biased MOS tunnel structures

M.I. Vexler, A. El Hdiy, D. Grgec, S.E. Tyaginov, R. Khlil, B. Meinerzhagen, A.F. Shulekin, I.V. Grekhov

Journal:

Microelectronics Journal

Year:

2006

Language:

english

File:

PDF, 300 KB

english, 2006

6

High-resolution scanning near-field EBIC microscopy: Application to the characterisation of a shallow ion implanted p+–n silicon junction

K. Smaali, J. Fauré, A. El Hdiy, M. Troyon

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 1.10 MB

english, 2008

7

Impact of the band–band tunneling in silicon on electrical characteristics of Al/SiO2/p+-Si structures with the sub-3 nm oxide under positive bias

A. El Hdiy, R. Khlil, Dj. Ziane, I.V. Grekhov, A.F. Shulekin, M.I. Vexler

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 119 KB

english, 2003

8

Stress field polarity effect on defects generation in thin silicon dioxide films

A. El-Hdiy, G. Salace, M. Jourdain, A. Meinertzhagen, D. Vuillaume

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 337 KB

english, 1997

9

Soft breakdown as a cause of current drop in an MOS tunnel structure

A. F. Shulekin, S. É. Tyaginov, R. Khlil, A. El Hdiy, M. I. Vexler

Journal:

Year:

2004

Language:

english

File:

PDF, 54 KB

english, 2004

10

Ge nanocrystals with highly uniform size distribution deposited on alumina at room temperature by pulsed laser deposition: structural, morphological, and charge trapping properties

J. Martín-Sánchez, L. Marques, E. M. F. Vieira, Q. T. Doan, A. Marchand, A. El Hdiy, A. G. Rolo, S. R. C. Pinto, M. M. D. Ramos, A. Chahboun, M. J. M. Gomes

Journal:

Journal of Nanoparticle Research

Year:

2012

Language:

english

File:

PDF, 936 KB

english, 2012

11

Electrical methods for estimating the correlation length of insulator thickness fluctuations in MIS tunnel structures

S.E. Tyaginov, M.I. Vexler, A. El Hdiy, K. Gacem, V. Zaporojtchenko

Journal:

Materials Science in Semiconductor Processing

Year:

2010

Language:

english

File:

PDF, 443 KB

english, 2010

12

Band-Gap Determination of the Native Oxide Capping Quantum Dots by Use of Different Kinds of Conductive AFM Probes: Example of InAs/GaAs Quantum Dots

Smaali, K., El Hdiy, A., Molinari, M., Troyon, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 340 KB

english, 2010

13

The no-thermal activation of the defect generation mechanism in a MOS structure

A. El-Hdiy, G. Salace, A. Meinertzhagen, M. Jourdain, C. Petit, A. Aassime

Journal:

Journal of Non-Crystalline Solids

Year:

1995

Language:

english

File:

PDF, 246 KB

english, 1995

14

Comparison of the generated oxide charge by injection of electrons for both polarities

A. Meinertzhagen, G. Yard, C. Petit, M. Jourdain, A. El-Hdiy, G. Salace, G. Reimbold

Journal:

Journal of Non-Crystalline Solids

Year:

1995

Language:

english

File:

PDF, 314 KB

english, 1995

15

[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Preparation and Physical Characterization of SnO

Haireche, Sofiane, Boumeddiene, A., Guittoum, A., El Hdiy, A., Boufelfel, Ahmed

Year:

2009

Language:

english

File:

PDF, 394 KB

english, 2009

16

Relaxation of interface states and positive charge in thin gate oxide after FowlerâNordheim stress

El Hdiy, A., Salace, G., Petit, C., Jourdain, M., Meinertzhagen, A.

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 507 KB

english, 1993

17

Structural, morphological and electronic study of CVD SnO2:Sb films

Haireche, S., Boumeddiene, A., Guittoum, A., El Hdiy, A., Boufelfel, A.

Journal:

Materials Chemistry and Physics

Year:

2013

Language:

english

File:

PDF, 795 KB

english, 2013

18

Ge nanocrystals formation on SiO 2 by dewetting: application to memory

Szkutnik, P. D., Karmous, A., Bassani, F., Ronda, A., Berbezier, I., Gacem, K., El Hdiy, A., Troyon, M.

Journal:

The European Physical Journal Applied Physics

Year:

2008

Language:

english

File:

PDF, 1.39 MB

english, 2008

19

Study of defects induced by high-electric-field stress into a thin gate oxide (11 nm) of metal-oxide-semiconductor capacitors

A. El-hdiy, G. Salace, C. Petit, M. Jourdain, D. Vuillaume

Year:

1993

Language:

english

File:

PDF, 1.00 MB

english, 1993

20

An unusual nonlinearity in current-voltage curves of a bidimensional electron gas at low temperatures

Khlil, R., El Hdiy, A., Cavanna, A., Laruelle, F., Jin, Y.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 329 KB

english, 2005

21

Relaxation of positive charge during bidirectional electric stress on metal–oxide–silicon capacitors

El-Hdiy, A., Ziane, Dj

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 292 KB

english, 1999

22

An aluminum-gate metal-oxide-silicon capacitor with a tunnel-thin oxide under the bidirectional electric stress

El Hdiy, A., Khlil, R., Jin, Y., Tyaginov, S. E., Shulekin, A. F., Vexler, M. I.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 346 KB

english, 2005

23

Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect

Smaali, K., Troyon, M., El Hdiy, A., Molinari, M., Saint-Girons, G., Patriarche, G.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 469 KB

english, 2006

24

Study of the interface-state formation at different temperatures

Year:

1993

Language:

english

File:

PDF, 561 KB

english, 1993

25

On the positive charge and interface states in metal-oxide-semiconductor capacitors

Meinertzhagen, A., Petit, C., Yard, G., Jourdain, M., El Hdiy, A.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 365 KB

english, 1996

26

Contribution to the 1/f noise analysis in a bi-dimensional electron gas

Mouetsi, Souheil, El Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 448 KB

english, 2013

27

Memory and Coulomb blockade effects in germanium nanocrystals embedded in amorphous silicon on silicon dioxide

Gacem, K., El Hdiy, A., Troyon, M., Berbezier, I., Szkutnik, P. D., Karmous, A., Ronda, A.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 466 KB

english, 2007

28

Positive charge and interface state generation in a thin gate oxide (30 nm) metal-oxide-semiconductor capacitor

El-Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 1.07 MB

english, 1994

29

Nano-electron beam induced current and hole charge dynamics through uncapped Ge nanocrystals

Marchand, A., El Hdiy, A., Troyon, M., Amiard, G., Ronda, A., Berbezier, I.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 954 KB

english, 2012

30

Bidirectional stress on a p-metal–oxide–silicon capacitor

Ziane, Dj., El-Hdiy, A., Salace, G.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 358 KB

english, 1999

31

Germanium nanocrystal density and size effects on carrier storage and emission

El Hdiy, A., Gacem, K., Troyon, M., Ronda, A., Bassani, F., Berbezier, I.

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 834 KB

english, 2008

32

Deep levels and low-frequency noise in AlGaAs∕GaAs heterostructures

Khlil, Rachid, El Hdiy, Abdelillah, Jin, Yong

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 338 KB

english, 2005

33

Positive charge instability during bidirectional stress on metal–oxide–silicon capacitors

Ziane, Dj., El-Hdiy, A.

Journal:

Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 341 KB

english, 2000

34

Electric transport in a AlGaAs∕GaAs structure from 300 K to 4.2 K

Khlil, R., Hdiy, A. El, Cavanna, A., Laruelle, F., Jin, Y.

Journal:

Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 305 KB

english, 2004

35

Electric bidirectional stress effects on metal–oxide–silicon capacitors

El-Hdiy, A., Ziane, Dj.

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 331 KB

english, 2001

36

Generation of Si–SiO2 interface states by high electric field stress from low (100 K) to high (450 K) temperatures

Vuillaume, Dominique, Mir, Abdellah, Bouchakour, Rachid, Jourdain, Marc, El-Hdiy, Abdelillah, Salace, Guy

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 1.75 MB

english, 1993

37

[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Using low frequency noise method to characterize an AlGaAs/GaAs high electron mobility heterostructure

Mouetsi, S., El Hdiy, A.

Year:

2010

Language:

english

File:

PDF, 604 KB

english, 2010

38

Conductive AFM microscopy study of the carrier transport and storage in Ge nanocrystals grown by dewetting

Gacem, K, El Hdiy, A, Troyon, M, Berbezier, I, Ronda, A

Journal:

Year:

2010

Language:

english

File:

PDF, 588 KB

english, 2010

39

Effects of local electric surface potential on holes charging process in uncapped germanium nanocrystal

Marchand, Aude, El Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 1.04 MB

english, 2015

40

Monte-Carlo simulation of nano-collected current from a silicon sample containing a linear arrangement of uncapped nanocrystals

Ledra, Mohammed, El Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 619 KB

english, 2015

41

Dependence of interface-state generation on field polarity in metal-oxide-silicon devices of various thicknesses and technologies

A. El-hdiy, D. Ziane, F. Nebel, D. Vuillaume, M. Jourdain

Year:

1999

Language:

english

File:

PDF, 210 KB

english, 1999

42

Surface recombination velocity effects on simulated electron beam induced current collected by a nanoscale electrode

Doan, Quang-Tri, Hamdouni, Abdelhamid, El Hdiy, Abdelillah

Journal:

Superlattices and Microstructures

Year:

2016

Language:

english

File:

PDF, 994 KB

english, 2016

43

Simulation of embedded nanocrystal effects on the electron beam induced current collected by a nano-electrode

El Hdiy, Abdelillah

Journal:

Superlattices and Microstructures

Year:

2016

Language:

english

File:

PDF, 1.21 MB

english, 2016

44

Nano-EBIC analysis: An attempt to describe the surface recombination effects by the modified Donolato probability

El Hdiy, Abdelillah

Journal:

Superlattices and Microstructures

Year:

2017

Language:

english

File:

PDF, 588 KB

english, 2017

45

Analysis by Monte – Carlo simulation of uncapped nanocrystals density effects on the collection efficiency

Doan, QuangTri, El Hdiy, Abdelillah, Duong, Xuan-Nui, Duong, Chinh-Cuong, Nguyen, Luong-Thien

Journal:

Superlattices and Microstructures

Year:

2017

Language:

english

File:

PDF, 605 KB

english, 2017

46

Theoretical analysis of the charge collection at a nano-Schottky contact

El Hdiy, Abdelillah

Journal:

Solid-State Electronics

Year:

2018

Language:

english

File:

PDF, 602 KB

english, 2018

47

Simulated Contrast of Two Dislocations

Ledra, M., El Hdiy, A.

Journal:

Year:

2019

Language:

english

File:

PDF, 512 KB

english, 2019

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